Design for Testability and for Built-In Self Test

MECH&AE 717.01

What is Design for Testability (DFT) and Built-in Self Test (BIST) and why do we need them?  The answer is economic and common sense.  If something is NOT testable, you can’t ever make sure it is working properly and obviously selling an untestable product is risky and makes no economic sense.  


What you can learn.

  • Determine how to integrate circuit designs with the needs of proper and comprehensive tests
  • Understand obstacles and how the design can be tailored to accommodate the needs for fault detection and diagnosis

About this course:

This short webinar – intended to make non-test engineers aware of Design for Testability (DFT) and Built-in Self Test (BIST) techniques – will provide you with an explanation that you can follow without all the technical details test professionals need to know. Nonetheless, you will learn JTAG, Boundary Scan, Built-In Self Test without having to become a test engineer. It is intended for Managers and Engineers of various disciplines who have heard test engineers appealing for DFT and BIST but found the rationale too detailed and too technical to really follow the arguments. All technical issues will be thoroughly explained so that non-technical attendees don’t get lost, yet technical attendees also learn applicable principles. Test engineers who attend will learn a good way to explain the concepts to their colleagues but do bring or send others to this webinar.

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